Phone Stress Test places a high load on the CPU, memory, and storage of an Android Phone or Tablet. The Android device will draw more power from the battery and will run hotter while the tests are running.
Phone Stress Test provides a test for a controlled environment to easily check your phone’s reliability and stability this high load.
If operating correctly, the device will automatically reduce the load so as to manage the temperature and power draw.
If not, your phone could crash or in the worst case scenario, catch fire.
Before you start, charge the battery to at least 30%, disconnect the charger, check your last backup and place your phone on a non-flammable surface. Please note that the tests will not start if the battery level is 3% or lower.
From the home screen, you can select a short or long Stress Test. This will start some automated stress testing of the CPU, memory, storage, and battery. Battery and temperature information is displayed during the test (where available). The temperature sensor shown is the temperature sensor with the maximum temperature. The battery level range and the maximum temperature during the automated testing are recorded and displayed in the test report.
The Android CPU stress test includes integer and floating point tests. A test is run simultaneously for each CPU core (e.g. 8 CPU tests will run simultaneously on an 8 core CPU).
It is interesting to note that during the Android CPU stress test some phones very quickly (e.g. 5 seconds) hit their thermal limit (e.g. 100C) and then throttle the CPU frequency to a lower value to reduce power and hence reduce the temperature. In this case, you will notice that the increase in the number of operations will reduce and the temperature will start to drop. This can be impacted by factors such as the immediate previous usage, the ambient temperature, the case, holding the device and of course the device itself.
Each Android CPU stress test will run for about 1 minute (short test) or 10 minutes (long test).
The memory stress test will write, read and verify memory available to andTest. Varying test patterns are used to try and uncover different types of memory problems. The memory test will run for about 1 minute (short test) or 10 minutes (long test).
The storage test will write, read and verify available storage. By default, the Internal storage will be tested (here internal refers to the internal storage available to applications). If the storage is split with a separate “primary shared storage” that is not removable (i.e. not a MicroSD card) and this has more available space, then this will be used instead.
An incrementing test data pattern is used. The storage test will run for one scan of the available storage or for a maximum of about 3 minutes (short test) or up to 30 minutes (long test).
The battery usage during the test will be checked and compared against predetermined percentage drops and if greater than these, the battery will be deemed NOK (Not OK).
Temperature sensors available on devices vary, examples are pa_therm0, pm8994_tz, pm8916_tz, and tsens_tz_sensor0. Generally speaking, the temperature sensors monitor temperatures in different zones and components of the device to ensure the device does not overheat. It does this by triggering a reduction in power to a circuit or throttling a clock to a slower frequency (e.g. reducing the CPU frequency).
- On a phone with a Qualcomm processor, the pa_therm0 temperature sensor is typically the heat sensor for the integrated power amplifier (pa) . This temperature sensor is used to modulate throughput and transmitting power. The more heat, the less through put and less power is allowed.
- The pm8916_tz, pm8941_tz, pm8994_tz are sensors from Qualcomm power management integrated circuits (PM8916, PM8941, PM8994) etc.
- The max170xx_battery is from the Maxim Integrated PMIC for battery management (e.g. Max17042 PMIC).
Phone Stress Test: Results report
An HTML results report is produced and can be emailed on the completion of the test. The report shows the test results and device information.